Number of items: 1.
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Jacques, Emmanuel and Pichon, Laurent and Debieu, Olivier and Gourbilleau, Fabrice (0201) Electrical behavior of MIS devices based on Si nanoclusters embedded in SiOxNyand SiO2 films. Nanoscale Research Letters, 6 (1). pp. 1-6.
This list was generated on Thu May 23 14:12:59 2013 BST.