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Effects of processing on the electrical and structural properties of spray deposited CdS:In thin films

Ikhmayies, Shadia J. and Ahmad-Bitar, Riyad N. (2009) Effects of processing on the electrical and structural properties of spray deposited CdS:In thin films. Physica B: Condensed Matter, 404 (16). 2419 - 2424.

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Official URL: http://www.sciencedirect.com/science/article/B6TVH...

Abstract

Polycrystalline CdS:In thin films were prepared by the Spray pyrolysis technique (SP) at a substrate temperature Ts=490 °C. The effects of annealing in nitrogen atmosphere at 400 °C and HCl-etching on the electrical and structural properties of the films were investigated. The electrical properties were studied through the analysis of the I–V curves, while the structural properties were studied through the analysis of the X-ray diffraction (XRD) patterns and the scanning electron microscope (SEM) images. An increase in the films’ resistivity was occurred after annealing and/or HCl-etching, which was accompanied by changes in the XRD patterns and SEM images. These changes were related to a phase change from the mixed (cubic and hexagonal) phase to the hexagonal phase which was expected to occur during the aforementioned processes. The X-ray diffraction (XRD) patterns and the scanning electron microscope images confirm this expectation.

Item Type:Article
Uncontrolled Keywords:Annealing; Cadmium sulfide; Etching; Semiconductors
Subjects:Material Science > Nanostructured materials
ID Code:8989
Deposited By:SPI
Deposited On:04 May 2010 16:30
Last Modified:04 May 2010 16:30

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