Huang, Jian Yu and Qi, Liang and Li, Ju (2010) In situ imaging of layer-by-layer sublimation of suspended graphene. Nano Research, 3 (1). pp. 43-50. ISSN 1998-0124 (print version) ISSN: 1998-0000 (electronic version)
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Official URL: http://www.thenanoresearch.com/files/43.pdf
Abstract
An individual suspended graphene sheet was connected to a scanning tunneling microscopy probe inside a transmission electron microscope, and Joule heated to high temperatures. At high temperatures and under electron beam irradiation, the few-layer graphene sheets were removed layer-by-layer in the viewing area until a monolayer graphene was formed. The layer-by-layer peeling was initiated at vacancies in individual graphene layers. The vacancies expanded to form nanometer-sized holes, which then grew along the perimeter and propagated to both the top and bottom layers of a bilayer graphene joined by a bilayer edge. The layer-by-layer peeling was induced by atom sublimation caused by Joule heating and facilitated by atom displacement caused by high-energy electron irradiation, and may be harnessed to control the layer thickness of graphene for device applications.
| Item Type: | Article |
|---|---|
| Subjects: | Analytical Science > Microscopy and probe methods Material Science > Nanofabrication processes and tools |
| ID Code: | 8097 |
| Deposited By: | M T V |
| Deposited On: | 18 Jan 2010 15:35 |
| Last Modified: | 18 Jan 2010 15:35 |
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