Macchi, C. and Somoza, A. and Mariazzi, S. and Brusa, R. S. and Vericat, C. and Vela, M. E. and Salvarezza, R. C. (2009) Characterization of high area nanostructured gold surfaces by slow positron depth profiling. Physica Status Solidi C - Current Topics in Solid State Physics, 6 (11). p. 2585. ISSN 1610-1634
Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.
Official URL: http://dx.doi.org/10.1002/pssc.200982106
Abstract
A monoenergetic positron beam was employed to characterize the uniformity and the nanostructures of gold surfaces layers grown using an electrochemical treatment. The results obtained indicate that positrons are sensitive to the roughness process and their different levels of roughness. They are discussed in terms of the morphological changes in the columnar-like structure formed during the roughening process.
| Item Type: | Article |
|---|---|
| Subjects: | Analytical Science > Beam methods |
| ID Code: | 8090 |
| Deposited By: | M T V |
| Deposited On: | 07 Jan 2010 10:20 |
| Last Modified: | 07 Jan 2010 10:20 |
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