Kupriyanov, L. and Galyamov, B. and Kozlova, N. and Roginskaya, Yu. (2009) Self-organization in thin films of nanocomposite silicon-carbon. Nanotechnologies in Russia, 4 . pp. 499-502.
Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.
Official URL: http://dx.doi.org/10.1134/S1995078009070118
In order to develop new materials for lithium batteries, thin films on based on Si/C nanocomposite have been synthesized and investigated. These films are produced by the consequent magnetron deposition of nanosize layers of carbon and silicon onto metallic substrates at under room temperature. The thickness of each layer is 1-6 nm, and the total thickness of the films varies from 100 to 400 nm. The film structure is examined by energy dispersive X-ray analysis (EDAX), optical and Raman spectroscopy, scanning electron microscopy (SEM), and atomic force microscopy (AFM). It is shown that the films are not layer structures as was expected; they are fractal disordered structures characterized by three scale levels: a matrix that consists of 20-30-nm particles, the aggregates (200 nm) stabilized in this matrix, and tiny particles 3-5 nm in size which are incorporated in large aggregates. The structure of the aggregates is analyzed by computer simulation. The values of fractal dimensionality are determined, and the ways of fractal structure formation and development are considered.
|Deposited By:||Prof. Alexey Ivanov|
|Deposited On:||11 Nov 2009 07:55|
|Last Modified:||11 Nov 2009 08:00|
Repository Staff Only: item control page