V.V., Egorov (2009) Surface Microroughnesses Influence on the Characteristics of the Images in Optic Precise Devices. The Scalar Approach. Part II. Journal of NANO and MICROSYSTEM TECHNIQUE (4).
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There are statistical fitches of field scattered by rough plane absolute soft surface is calculated in that article. It is indicated that field calculated by the integral equation method is differs of Kirhgoff s approach field.
|Deposited By:||Prof. Alexey Ivanov|
|Deposited On:||11 Nov 2009 07:53|
|Last Modified:||11 Nov 2009 08:00|
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