Nano Archive

A study of the Morphology and Optical Properties of Electropolished Aluminum in the Vis-IR region

Adelkhani, H. and Nasoodi, S. and Jafari, A. H. (2009) A study of the Morphology and Optical Properties of Electropolished Aluminum in the Vis-IR region. INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE , 4 (2). pp. 238-246. ISSN 1452-3981

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Abstract

In this paper, the commercial pure aluminum specimens (Al 99.3 %) are electropolished in an acidic electrolyte. The morphology, reflection, and roughness of the specimens are investigated. Scanning Electron Microscopy (SEM), Energy Dispersive X-ray (EDX), X-ray Fluorescence (XRF), Vis-IR Spectroscopy, and Dek-Tak method are used to characterize of specimens. The results show that by increasing current density from 5 A/dm(2) to 25 A/dm(2) the roughness and reflectance of Al specimens decrease/increase respectively. The opposite trend is seen when the current density increases more than 25 A/dm(2). The roughness of Al specimen before electropolishing is 3.45 mm and it will decrease to 0.45 square m by electropolishing at optimum conditions. A similar trend is also seen in reflection; it increases from 10% to 93% for the optimized electropolishing specimen. The SEM study confirms that the electropolishing could decrease the surface roughness, and it can form a smooth surface in micro/nano meter scale. According to the results, the metal mirror that is prepared by Physical Vapor Deposition (PVD) method has higher reflectance in comparison with the optimized electropolishing specimen. It shows that the purity of Al also has an essential effect on the reflection spectra.

Item Type:Article
Subjects:Physical Science > Nanophysics
Physical Science > Nano objects
Material Science > Nanochemistry
Material Science > Nanostructured materials
Divisions:Faculty of Engineering, Science and Mathematics > School of Physics
Faculty of Engineering, Science and Mathematics > School of Chemistry
ID Code:7318
Deposited By:JNCASR
Deposited On:28 Oct 2009 09:40
Last Modified:28 Oct 2009 09:40

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