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Transmission electron microscopy and Rutherford backscattering spectrometry studies of Ag2Te films formed from Ag-Te thin film couples

Mohanty , B. C. and Kasiviswanathan , S. (2006) Transmission electron microscopy and Rutherford backscattering spectrometry studies of Ag2Te films formed from Ag-Te thin film couples. Crystal Research and Technology, 41 (1). pp. 59-63. ISSN 0232-1300

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Official URL: http://www3.interscience.wiley.com/journal/1122171...

Abstract

Formation of Ag2Te thin films from room temperature (300 K) solid state reaction of Ag and Te thin film couples is investigated. Rutherford Backscattering Spectrometry (RBS) studies confirmed the complete miscibility of the couples and the stoichiometry of the resulting Ag2Te. Structural analysis by Transmission Electron Microscopy (TEM) showed a fine-grained structure with monoclinic and orthorhombic phases. Annealing at high temperatures resulted in the growth of giant crystallites with monoclinic phase at random sites.

Item Type:Article
Subjects:Physical Science > Nanophysics
Physical Science > Nano objects
Material Science > Nanochemistry
Material Science > Nanostructured materials
Divisions:Faculty of Engineering, Science and Mathematics > School of Physics
Faculty of Engineering, Science and Mathematics > School of Chemistry
ID Code:7102
Deposited By:JNCASR
Deposited On:02 Sep 2009 11:32
Last Modified:02 Sep 2009 11:32

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