Du, H and Lee, S. W. and Gong, J and Sun, C and Wen, L. S. (2004) Size effect of nano-copper films on complex optical constant and permittivity in infrared region. Materials Letters, 58 (6). 1117 - 1120.
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Official URL: http://www.sciencedirect.com/science/article/B6TX9...
Nano-copper films were prepared by DC magnetron sputtering. Their reflectivity and transmittivity to electromagnetic wave in infrared region were measured with Fourier Transformation Infrared Spectrometer (FTIR), by which their complex optical constant and permittivity were obtained. The results show that the complex optical constant and permittivity of nano-copper films depend upon the film thickness. This dependence is correlated with microstructure transition during the film growth.
|Uncontrolled Keywords:||Magnetron sputtering; Nano-copper film; Complex optical constant; Complex permittivity; Size effect|
|Subjects:||Material Science > Nanostructured materials|
|Deposited On:||24 Sep 2009 16:36|
|Last Modified:||24 Sep 2009 16:36|
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