Chanda, S. C. and Manna, A and Vijayan, V and Nayak, Pranaba K. and Ashok, M and Acharya, H. N. (2007) PIXE & XRD analysis of nanocrystals of Fe, Ni and Fe2O3. Materials Letters, 61 (28). 5059 - 5062.
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Official URL: http://www.sciencedirect.com/science/article/B6TX9...
Nanocrystalline materials have become a subject of both scientific and industrial importance in the past decade. The present work deals with the preparation of α-Fe and Ni powders by high-energy ball mill method and chemically prepared α-Fe2O3 powders of nano crystalline type respectively. There is a need to characterize the trace elements in order to check the purity of these samples. The results of trace element analysis of these nanocrystals by using PIXE, characterization and size determination by XRD using Debye–Scherrer formula with full-width at half-maximum(FWHM) have been discussed.Nanocrystallinity is examined already by (TEM,FTIR and MICRO-RAMAN) experiments done previously.
|Uncontrolled Keywords:||Nanocrystal; Characterization; Mechanical milling; XRD; PIXE|
|Subjects:||Material Science > Nanostructured materials|
|Deposited On:||10 Feb 2010 09:24|
|Last Modified:||10 Feb 2010 09:24|
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