Deng, J. and Hofbauer, W. and Chandrasekhar, N. and O'Shea, S. J. (2007) Metallization for crossbar molecular devices. NANOTECHNOLOGY, 18 (15).
Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.
Official URL: http://www.iop.org/EJ/abstract/0957-4484/18/15/155...
Self-assembled organic monolayer nanopore crossbar junctions were fabricated as a test structure for molecular electronics. The device yield, which is typically very low due to electrical shorting on top electrode deposition, is studied for different deposition parameters, and a clear improvement ( up to 45% yield) is obtained by indirect deposition of silver electrodes on cooled substrates. Nevertheless, the yield fluctuates strongly from run to run (similar to 8% to similar to 45%), implying that reliable device fabrication remains challenging. We find a small number of devices (< 1%) show switching behaviour in conductivity, presumably due to metal filaments.
|Uncontrolled Keywords:||NEGATIVE DIFFERENTIAL RESISTANCE; NANOIMPRINT LITHOGRAPHY; GOLD ELECTRODES; MONOLAYER; FABRICATION; CONDUCTANCE; RECTIFICATION; JUNCTIONS|
|Subjects:||Material Science > Nanofabrication processes and tools|
|Deposited On:||28 Sep 2009 10:11|
|Last Modified:||28 Sep 2009 10:11|
Repository Staff Only: item control page