Nano Archive

Critical strain region evaluation of self-assembled semiconductor quantum dots

Sales, D. L. and Pizarro, J. and Galindo, P. L. and Garcia, R. and Trevisi, G. and Frigeri, P. and Nasi, L. and Franchi, S. and Molina, S. I. (2007) Critical strain region evaluation of self-assembled semiconductor quantum dots. NANOTECHNOLOGY, 18 (47).

[img]PDF - Published Version
1035Kb

Official URL: http://www.iop.org/EJ/toc/0957-4484/18/47

Abstract

A novel peak finding method to map the strain from high resolution transmission electron micrographs, known as the Peak Pairs method, has been applied to In(Ga) As/AlGaAs quantum dot (QD) samples, which present stacking faults emerging from the QD edges. Moreover, strain distribution has been simulated by the finite element method applying the elastic theory on a 3D QD model. The agreement existing between determined and simulated strain values reveals that these techniques are consistent enough to qualitatively characterize the strain distribution of nanostructured materials. The correct application of both methods allows the localization of critical strain zones in semiconductor QDs, predicting the nucleation of defects, and being a very useful tool for the design of semiconductor devices.

Item Type:Article
Subjects:Material Science > Tunnelling and microscopic phenomena
Analytical Science > Microscopy and probe methods
Technology > Manufacturing processes for nanotechnology
Physical Science > Nanoelectronics
Physical Science > Quantum phenomena
ID Code:6331
Deposited By:IoN
Deposited On:08 Dec 2009 15:35
Last Modified:08 Dec 2009 16:43

Repository Staff Only: item control page