Tabard-Cossa, Vincent and Trivedi, Dhruti and Wiggin, Matthew and Jetha, Nahid N. and Marziali, Andre (2007) Noise analysis and reduction in solid-state nanopores. NANOTECHNOLOGY, 18 (30).
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Abstract
The electrical noise characteristics of ionic current through organic and synthetic nanopores have been investigated. Comparison to proteinaceous alpha-Hemolysin pores reveals two dominant noise sources in silicon nitride nanometre-scale pores: a high-frequency noise associated with the capacitance of the silicon support chip (dielectric noise), and a low-frequency current fluctuation with 1/fα characteristics (flicker noise). We present a technique for reducing the dielectric noise by curing polydimethylsiloxane (PDMS) on the nanopore support chip. This greatly improves the performance of solid-state nanopore devices, yielding an unprecedented signal-to-noise ratio when observing dsDNA translocation events and ssDNA probe capture for force spectroscopy applications.
| Item Type: | Article |
|---|---|
| Subjects: | Material Science > Nanostructured materials |
| ID Code: | 6291 |
| Deposited By: | IoN |
| Deposited On: | 10 Sep 2009 11:27 |
| Last Modified: | 10 Sep 2009 11:27 |
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