Ma, Z. S. and Long, S. G. and Zhou, Y. C. and Pan, Y. (2008) Indentation scale dependence of tip-in creep behavior in Ni thin films. SCRIPTA MATERIALIA, 59 (2). pp. 195-198.
Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.
Official URL: http://www.sciencedirect.com/science?_ob=ArticleUR...
Abstract
Nanoindentation creep tests have been performed under a constant rate P/P = 0.1 s(-1) with the holding load ranging from 1000 to 9000 mu N to investigate the dependence of indentation creep behavior of Ni films. The results show that the creep rate, creep stain rate, indentation stress and even stress exponents are all indentation depth dependent. Based on the experimental results, it is inferred that the creep is likely dominated by grain boundary sliding and a grain rotation mechanism for small indentation loads but by dislocation climb for large indents. Published by Elsevier Ltd. on behalf of Acta Materialia Inc.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | nickel film; nanoindentation; creep; stress exponent |
| Subjects: | Physical Science > Nanophysics Analytical Science > Microscopy and probe methods Material Science > Soft materials |
| ID Code: | 6045 |
| Deposited By: | IoN |
| Deposited On: | 13 Apr 2010 09:28 |
| Last Modified: | 13 Apr 2010 09:28 |
Repository Staff Only: item control page
