Nano Archive

Indentation scale dependence of tip-in creep behavior in Ni thin films

Ma, Z. S. and Long, S. G. and Zhou, Y. C. and Pan, Y. (2008) Indentation scale dependence of tip-in creep behavior in Ni thin films. SCRIPTA MATERIALIA, 59 (2). pp. 195-198.

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Abstract

Nanoindentation creep tests have been performed under a constant rate P/P = 0.1 s(-1) with the holding load ranging from 1000 to 9000 mu N to investigate the dependence of indentation creep behavior of Ni films. The results show that the creep rate, creep stain rate, indentation stress and even stress exponents are all indentation depth dependent. Based on the experimental results, it is inferred that the creep is likely dominated by grain boundary sliding and a grain rotation mechanism for small indentation loads but by dislocation climb for large indents. Published by Elsevier Ltd. on behalf of Acta Materialia Inc.

Item Type:Article
Uncontrolled Keywords:nickel film; nanoindentation; creep; stress exponent
Subjects:Physical Science > Nanophysics
Analytical Science > Microscopy and probe methods
Material Science > Soft materials
ID Code:6045
Deposited By:IoN
Deposited On:13 Apr 2010 09:28
Last Modified:13 Apr 2010 09:28

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