Hibbard, G. D. and Radmilovic, V. and Aust, K. T. and Erb, U. (2008) Grain boundary migration during abnormal grain growth in nanocrystalline Ni. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 494 (1-2, Sp. Iss. SI). pp. 232-238.
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The transformation mechanisms of abnormal grain growth in nanocrystalline Ni were studied extensively by transmission electron microscopy (TEM). A combination of in situ TEM annealing and ex situ annealing followed by TEM characterization was used. It was observed that grain boundary migration is both spatially and temporally non-uniform; migration occurs in a series of discrete steps, which are followed by periods of stagnation. (C) 2008 Elsevier B.V. All rights reserved.
|Uncontrolled Keywords:||Nanostructured materials; Grain growth; Nickel; In situ electron microscopy|
|Subjects:||Material Science > Functional and hybrid materials|
|Deposited On:||04 Sep 2009 11:37|
|Last Modified:||04 Sep 2009 11:37|
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