Nano Archive

Scanning near-field optical microscopy and near-field optical probes: properties, fabrication, and control of parameters

Dryakhlushin, V F and Veiko, V P and Voznesenskii, N B (2007) Scanning near-field optical microscopy and near-field optical probes: properties, fabrication, and control of parameters. Quantum Electronics, 37 (2). pp. 193-203.

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Official URL: http://stacks.iop.org/1063-7818/37/193

Abstract

A brief review of modern applications of scanning near-field optical (SNO) devices in microscopy, spectroscopy, and lithography is presented in the introduction. The problem of the development of SNO probes, as the most important elements of SNO devices determining their resolution and efficiency, is discussed. Based on the works of the authors, two different methods for fabricating SNO probes by using the adiabatic tapering of an optical fibre are considered: the laser-heated mechanical drawing and chemical etching. A nondestructive optical method for controlling the nanometre aperture of SNO probes is proposed, substantiated, and tested experimentally. The method is based on the reconstruction of a near-field source with the help of a theoretical algorithm of the inverse problem from the experimental far-filed intensity distribution. Some prospects for a further refinement of the construction and technology of SNO probes are discussed.

Item Type:Article
ID Code:5355
Deposited By:Prof. Alexey Ivanov
Deposited On:06 Feb 2010 11:10
Last Modified:06 Feb 2010 11:53

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