Cano, A I Diaz and Torchynska, T and Rodriguez, M Moralez and Sandoval, S Jimenez and Minbaeva, M (2007) Optical and structural evaluation of SiC nanocrystallites. Journal of Physics: Conference Series, 61 . pp. 243-246.
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Official URL: http://stacks.iop.org/1742-6596/61/243
Abstract
This paper presents results of the non-contact and non-destructive characterization of porous SiC layers using Raman scattering spectroscopy, scanning electron microscopy as well as atomic force microscopy methods. The comparative study of the Raman spectroscopy on the bulk SiC and porous SiC layers has shown a number of new features specific for nanocrystallite materials, which have been analyzed and discussed.
| Item Type: | Article |
|---|---|
| ID Code: | 5350 |
| Deposited By: | Prof. Alexey Ivanov |
| Deposited On: | 06 Feb 2010 11:10 |
| Last Modified: | 06 Feb 2010 11:53 |
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