Soshnikov, A I and Gogolinsky, K V and Blank, V D and Reshetov, V N (2007) The measurement of electrical properties of nanostructures with use of conductive diamond tip. Journal of Physics: Conference Series, 61 . pp. 730-734.
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Official URL: http://stacks.iop.org/1742-6596/61/730
The use of doped full-diamond tips in SPM to measure electrical properties with nanoscale resolution is described. The method enables to measure electrical impedance, capacity and conductivity of semiconductors. The experimental results shows a wide range of benefits in investigation and creation of elements for micro and nano-electronics. According to multiple experiments, the characteristics of diamond tips are very stable during scanning, indenting and electrical measurements.
|Deposited By:||Prof. Alexey Ivanov|
|Deposited On:||06 Feb 2010 11:10|
|Last Modified:||06 Feb 2010 11:53|
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