Nanoscale polarization patterning of ferroelectric Langmuir–Blodgett P(VDF-TrFE) films

Abstract

This paper reports nanoscale piezoelectric measurements on ferroelectric poly(vinylidene fluoride-co-trifluoroethylene) (P(VDF-TrFE)) films prepared by the Langmuir–Blodgett (LB) technique. Polarization patterning, piezoelectric hysteresis and relaxation after poling are studied in this work by piezoresponse force microscopy. High quality P(VDF-TrFE) films with a copolymer content of 30% were fabricated using a Schaefer monolayer transfer setup permitting precise control of the film microstructure. The thickness of the films deposited with 100 transfers was ~64 nm. Local switching resulted in written polarization lines with the lateral size in the range 70–300 nm depending on polarization time. Local hysteresis loop (at a fixed tip position) demonstrated clear ferroelectric switching with the coercive voltage 8–10 V that corresponds to a macroscopic switching field (~1.5 MV cm−1) at a ~10 nm depth below the tip. Relatively slow ageing after poling was observed with the characteristic relaxation time of about 1500–2000 s depending on the polarization direction. The obtained results demonstrate that the stable polarization patterns can be created in LB P(VDF-TrFE) films and attest them as suitable candidates for memory and nanotemplate applications.