Nano Archive

Determination of piezoelectric coefficients and elastic constant of thin films by laser scanning vibrometry techniques

Huang, Z and Leighton, G and Wright, R and Duval, F and Chung, H. C. and Kirby, P and Whatmore, R. W. (2007) Determination of piezoelectric coefficients and elastic constant of thin films by laser scanning vibrometry techniques. Sensors and Actuators A: Physical, 135 (2). 660 - 665.

Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.

Official URL: http://www.sciencedirect.com/science/article/B6THG...

Abstract

Knowledge of the electro-active properties of piezoelectric materials is essential for the modeling and design of novel MEMS devices employing the piezoelectric effect. Cantilevers of piezoelectric thin film on Si were fabricated by using sol–gel and photolithograph wafer processing techniques. A scanning laser vibrometer was used to measure the displacement at the contact pad, the first resonant frequency and the tip deflection of the cantilever. The longitudinal (d33,f), transverse (d31,f) piezoelectric coefficients, and the Young's modulus for the piezoelectric thin films were then determined from these results. Finite element analysis (FEA) modeling was carried out to understand the device behaviors and a good agreement has been found between the measurement and the FEA simulated results.

Item Type:Article
Uncontrolled Keywords:PZT; Piezoelectric coefficients; Interferometer; Laser scanning vibrometer; Sol–gel
Subjects:Analytical Science > Nanotechnology for sensing and actuating
ID Code:4810
Deposited By:SPI
Deposited On:06 May 2009 10:36
Last Modified:06 May 2009 10:36

Repository Staff Only: item control page