Nano Archive

Gold-coated conducting-atomic force microscopy probes

Kulkarni, G. U. and JOHN, NEENA SUSAN (2005) Gold-coated conducting-atomic force microscopy probes. ournal of nanoscience and nanotechnology , 5 (4). pp. 587-591. ISSN 1533-4880

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Abstract

Some aspects of the performance of gold-coated conductive probes used in conducting atomic force microscopy (C-AFM) technique are discussed. The resistance of the nanocontact between the gold-coated AFM tip and the graphite substrate has been monitored at various applied forces. For small forces (<50 nN), resistance on the order of a few kiloohms was observed. Minimal contact resistance was observed for forces in the range 100-150 nN, beyond which the tip seems to undergo plastic deformation. The resistance of the nanocontact increased when current on the order of 100 μA was allowed to pass through, finally resulting in melting of the gold coating

Item Type:Article
Subjects:Material Science > Nanofabrication processes and tools
Material Science > Nanostructured materials
Divisions:Faculty of Engineering, Science and Mathematics > School of Physics
Faculty of Engineering, Science and Mathematics > School of Chemistry
ID Code:4405
Deposited By:JNCASR
Deposited On:03 Apr 2009 06:34
Last Modified:03 Apr 2009 06:34

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