Kulkarni, G. U. and JOHN, NEENA SUSAN (2005) Gold-coated conducting-atomic force microscopy probes. ournal of nanoscience and nanotechnology , 5 (4). pp. 587-591. ISSN 1533-4880
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Abstract
Some aspects of the performance of gold-coated conductive probes used in conducting atomic force microscopy (C-AFM) technique are discussed. The resistance of the nanocontact between the gold-coated AFM tip and the graphite substrate has been monitored at various applied forces. For small forces (<50 nN), resistance on the order of a few kiloohms was observed. Minimal contact resistance was observed for forces in the range 100-150 nN, beyond which the tip seems to undergo plastic deformation. The resistance of the nanocontact increased when current on the order of 100 μA was allowed to pass through, finally resulting in melting of the gold coating
| Item Type: | Article |
|---|---|
| Subjects: | Material Science > Nanofabrication processes and tools Material Science > Nanostructured materials |
| Divisions: | Faculty of Engineering, Science and Mathematics > School of Physics Faculty of Engineering, Science and Mathematics > School of Chemistry |
| ID Code: | 4405 |
| Deposited By: | JNCASR |
| Deposited On: | 03 Apr 2009 06:34 |
| Last Modified: | 03 Apr 2009 06:34 |
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