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Formation of a rectifier with gold nanoclusters: X-ray reflectivity and atomic force microscopy measurements

Pal, S. and Sanyal, M. K. and John , Neena S. and Kulkarni, G. U. (2005) Formation of a rectifier with gold nanoclusters: X-ray reflectivity and atomic force microscopy measurements. Physical Review B, 71 (12). 121404.

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Official URL: http://prola.aps.org/abstract/PRB/v71/i12/e121404

Abstract

We demonstrate that monolayer and bilayer films of thiol-capped gold nanoclusters can exhibit prominent rectification properties, provided spatial asymmetry exists between the two tunnel junctions used to connect the nanoclusters. Systematic x-ray reflectivity and atomic force microscopy (AFM) measurements were carried out to characterize the spatial asymmetry introduced by a monolayer of fatty acid salt used to deposit thiol-capped gold nanoclusters on a hydrophilic SiO2-Si(001) substrate using the Langmuir–Blodgett technique. Current-voltage characteristics, obtained from conducting probe AFM measurements, show rectification ratios of 13.5 and 364.8 for the monolayer and bilayer films, respectively.

Item Type:Article
Subjects:Material Science > Functional and hybrid materials
Material Science > Nanofabrication processes and tools
Divisions:Faculty of Engineering, Science and Mathematics > School of Physics
Faculty of Engineering, Science and Mathematics > School of Chemistry
ID Code:4403
Deposited By:JNCASR
Deposited On:02 Apr 2009 11:16
Last Modified:02 Apr 2009 11:16

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