Nano Archive

Dielectric relaxation in Ge1-xSe2Pbx (x=0, 0.2 and 0.6) nano-crystalline system

Sedeek, K and Adam, A and Wahab, L. A. and Hafez, F. M. (2004) Dielectric relaxation in Ge1-xSe2Pbx (x=0, 0.2 and 0.6) nano-crystalline system. Materials Chemistry and Physics, 85 (1). 20 - 26.

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Official URL: http://www.sciencedirect.com/science/article/B6TX4...

Abstract

Measurements of the ac conductivity and the dielectric loss of Pb modified Ge1−xSe2Pbx disordered system (x=0, 0.2 and 0.6) have been carried out in the frequency range 100 Hz–20 kHz and at temperature from 303 to 433 K. The virgin and the x=0.2 samples data shows a normal behavior according to the relation σac(ω)=AωS. However, the x=0.6 sample behaves differently. The exponent(s) measured for the two modified samples shows sub-linear relation depending on the temperature of measurements. The experimental results of the highly modified sample are interpreted in terms of the coexistence of two parallel conduction mechanisms; the predominance of each depends on both temperature and frequency.

Item Type:Article
Uncontrolled Keywords:Nanocrystalline
Subjects:Physical Science > Nanophysics
Physical Science > Nanoelectronics
Material Science > Nanostructured materials
ID Code:4039
Deposited By:SPI
Deposited On:27 Jan 2009 14:50
Last Modified:12 Feb 2009 12:04

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