John, N.S. and Pati, S.K and Kulkarni, G.U. (2008) Electrical characteristics of layered palladium alkanethiolates by conducting atomic force microscopy. Appl. Phys .Letters, 92 . 013120.
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Abstract
Current-voltage measurements on individual Pd(II) alkanethiolate nanostructures of varying bilayer thicknesses (hexyl to hexadecyl) employing conducting atomic force microscopy have shown the presence of a low current region near zero bias, the width of which increases with the bilayer thickness. The resistance in this region varies exponentially with the bilayer thickness with a low decay parameter value of 0.2±0.04 Å−1 indicating a long-range nonresonant tunneling through the alkyl chains. The changeover from low current to high current with increasing bias is accompanied by a negative differential resistance feature, which arises due to Pd–S charge transfer.
| Item Type: | Article |
|---|---|
| Subjects: | Material Science > Nanofabrication processes and tools |
| Divisions: | Faculty of Engineering, Science and Mathematics > School of Chemistry |
| ID Code: | 3954 |
| Deposited By: | JNCASR |
| Deposited On: | 03 Feb 2009 04:12 |
| Last Modified: | 03 Feb 2009 04:12 |
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