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Electrical characteristics of layered palladium alkanethiolates by conducting atomic force microscopy.

John, N.S. and Pati, S.K and Kulkarni, G.U. (2008) Electrical characteristics of layered palladium alkanethiolates by conducting atomic force microscopy. Appl. Phys .Letters, 92 . 013120.

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Abstract

Current-voltage measurements on individual Pd(II) alkanethiolate nanostructures of varying bilayer thicknesses (hexyl to hexadecyl) employing conducting atomic force microscopy have shown the presence of a low current region near zero bias, the width of which increases with the bilayer thickness. The resistance in this region varies exponentially with the bilayer thickness with a low decay parameter value of 0.2±0.04 Å−1 indicating a long-range nonresonant tunneling through the alkyl chains. The changeover from low current to high current with increasing bias is accompanied by a negative differential resistance feature, which arises due to Pd–S charge transfer.

Item Type:Article
Subjects:Material Science > Nanofabrication processes and tools
Divisions:Faculty of Engineering, Science and Mathematics > School of Chemistry
ID Code:3954
Deposited By:JNCASR
Deposited On:03 Feb 2009 04:12
Last Modified:03 Feb 2009 04:12

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