Xu, S Y and Xu, J and Tian, M.L (2006) A low cost platform for linking transport properties to the structure of nanomaterials. Nanotechnology, 17 (5). p. 1470. ISSN 09574484
Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.
Official URL: http://dx.doi.org/10.1088/0957-4484/17/5/051
A low cost platform made of a silicon nitride window with pre-patterned metallic leads has been fabricated. The platform is compatible for both transmission electron microscopy (TEM) studies and electrical transport measurements. We demonstrated that TEM analyses, in situ local structure modification with a high intensity electron beam and ex situ transport measurements can be performed for the same individual nanowire assembled on this platform. The platform can therefore be used to directly link the transport properties of a testing nanomaterial or a nanodevice to its morphological, structural and chemical properties.
|Subjects:||Material Science > Nanostructured materials|
|Deposited By:||Lesley Tobin|
|Deposited On:||22 Oct 2008 15:26|
|Last Modified:||22 Jan 2009 14:40|
Repository Staff Only: item control page