Hoffmann, S and Utke, I and Moser, B and Michler, J and Christiansen, S. H. and Schmidt, V and Senz, S and Werner, P and Gösele, Ulrich and Ballif, C (2006) Measurement of the bending strength of vapor-liquid-solid grown silicon nanowires. NANO LETTERS, 6 (4). pp. 622-625.
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Official URL: http://dx.doi.org/10.1021/nl052223z
Abstract
The fracture strength of silicon nanowires grown on a [111] silicon substrate by the vapor-liquid-solid process was measured. The nanowires, with diameters between 100 and 200 nm and a typical length of 2 mu m, were subjected to bending tests using an atomic force microscopy setup inside a scanning electron microscope. The average strength calculated from the maximum nanowire deflection before fracture was around 12 GPa, which is 6% of the Young's modulus of silicon along the nanowire direction. This value is close to the theoretical fracture strength, which indicates that surface or volume defects, if present, play only a minor role in fracture initiation.
| Item Type: | Article |
|---|---|
| Subjects: | Engineering > Nanotechnology applications in mechanical engineering Material Science > Nanofabrication processes and tools Physical Science > Nanoelectronics Material Science > Nanostructured materials |
| ID Code: | 3759 |
| Deposited By: | SPI |
| Deposited On: | 26 Jan 2009 11:43 |
| Last Modified: | 03 Mar 2009 13:59 |
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