Nano Archive

Scaling of resistance and electron mean free path of single-walled carbon nanotubes

Purewal, Meninder S. and Hong, Byung Hee and Ravi, Anirudhh and Chandra, Bhupesh and Hone, James and Kim, Philip (2007) Scaling of resistance and electron mean free path of single-walled carbon nanotubes. PHYSICAL REVIEW LETTERS, 98 (18).

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Official URL: http://link.aps.org/doi/10.1103/PhysRevLett.98.186...

Abstract

We present an experimental investigation on the scaling of resistance in individual single-walled carbon nanotube devices with channel lengths that vary 4 orders of magnitude on the same sample. The electron mean free path is obtained from the linear scaling of resistance with length at various temperatures. The low temperature mean free path is determined by impurity scattering, while at high temperature, the mean free path decreases with increasing temperature, indicating that it is limited by electron-phonon scattering. An unusually long mean free path at room temperature has been experimentally confirmed. Exponentially increasing resistance with length at extremely long length scales suggests anomalous localization effects.

Item Type:Article
Subjects:Physical Science > Nano objects
Physical Science > Nanoelectronics
ID Code:3217
Deposited By:Anuj Seth
Deposited On:14 Jan 2009 15:25
Last Modified:20 Jan 2009 16:02

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