Purewal, Meninder S. and Hong, Byung Hee and Ravi, Anirudhh and Chandra, Bhupesh and Hone, James and Kim, Philip (2007) Scaling of resistance and electron mean free path of single-walled carbon nanotubes. PHYSICAL REVIEW LETTERS, 98 (18).
Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.
Official URL: http://link.aps.org/doi/10.1103/PhysRevLett.98.186...
We present an experimental investigation on the scaling of resistance in individual single-walled carbon nanotube devices with channel lengths that vary 4 orders of magnitude on the same sample. The electron mean free path is obtained from the linear scaling of resistance with length at various temperatures. The low temperature mean free path is determined by impurity scattering, while at high temperature, the mean free path decreases with increasing temperature, indicating that it is limited by electron-phonon scattering. An unusually long mean free path at room temperature has been experimentally confirmed. Exponentially increasing resistance with length at extremely long length scales suggests anomalous localization effects.
|Subjects:||Physical Science > Nano objects|
Physical Science > Nanoelectronics
|Deposited By:||Anuj Seth|
|Deposited On:||14 Jan 2009 15:25|
|Last Modified:||20 Jan 2009 16:02|
Repository Staff Only: item control page