Lan, Chun and Srisungsitthisunti, Pornsak and Amama, Placidus B. and Fisher, Timothy S. and Xu, Xianfan and Reifenberger, Ronald G. (2008) Measurement of metal/carbon nanotube contact resistance by adjusting contact length using laser ablation. NANOTECHNOLOGY, 19 (12).
Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.
Official URL: http://dx.doi.org/10.1088/0957-4484/19/12/125703
Abstract
A technique of measuring contact resistance between an individual nanotube and a deposited metallic film is described. Using laser ablation to sequentially shorten the contact length between a nanotube and the evaporated metallic film, the linear resistivity of the nanotube as well as the specific contact resistivity between the nanotube and metallic film can be determined. This technique can be generally used to measure the specific contact resistance that develops between a metallic film and a variety of different nanowires and nanotubes.
| Item Type: | Article |
|---|---|
| Subjects: | Material Science > Nanofabrication processes and tools Physical Science > Nano objects Physical Science > Nanoelectronics |
| ID Code: | 2444 |
| Deposited By: | Farnush Anwar |
| Deposited On: | 07 Jan 2009 14:11 |
| Last Modified: | 09 Jan 2009 10:55 |
Repository Staff Only: item control page
