Stan, G. and Cook, R. F. (2008) Mapping the elastic properties of granular Au films by contact resonance atomic force microscopy. NANOTECHNOLOGY, 19 (23).
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Official URL: http://www.iop.org/EJ/abstract/0957-4484/19/23/235...
Endowed with nanoscale spatial resolution, contact resonance atomic force microscopy (CR-AFM) provides extremely localized elastic property measurements. We advance here the applicability of CR-AFM on surfaces with nanosize features by considering the topography contribution to the CR-AFM signal. On nanosize granular Au films, the elastic modulus at the grain scale has been mapped out by considering a self-consistent deconvolution of the contact geometry effect in the CR-AFM image. Significant variation in the contact area over granular topography arises as the probe is either in single- or multiple-asperity contact with the surface. Consequently, in extracting the elastic modulus from CR-AFM measurements on granular surfaces we considered both the normal and lateral couplings established through multiple-asperity contacts between the tip and the surface. Thus, by appropriately considering the change in the contact mechanics during CR-AFM imaging, variations in the elastic modulus have been revealed in the intergrain regions as well as across individual grains.
|Subjects:||Physical Science > Nanophysics|
Analytical Science > Microscopy and probe methods
|Deposited By:||Anuj Seth|
|Deposited On:||17 Dec 2008 12:24|
|Last Modified:||17 Dec 2008 12:24|
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