Nano Archive

Scanning electron microscopy of nanoscale chemical patterns

Srinivasan, Charan and Mullen, Thomas J. and Hohman, J. Nathan and Anderson, Mary E. and Dameron, Arrelaine A. and Andrews, Anne M. and Dickey, Elizabeth C. and Horn, Mark W. and Weiss, Paul S. (2007) Scanning electron microscopy of nanoscale chemical patterns. ACS NANO, 1 (3). pp. 191-201.

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Official URL: http://dx.doi.org/10.1021/nn7000799

Abstract

A series of nanoscale chemical patterning methods based on soft and hybrid nanolithographies have been characterized using scanning electron microscopy with corroborating evidence from scanning tunneling microscopy and lateral force microscopy. We demonstrate and discuss the unique advantages of the scanning electron microscope as an analytical tool to image chemical patterns of molecules highly diluted within a host self-assembled monolayer and to distinguish regions of differential mass coverage in patterned self-assembled monolayers. We show that the relative contrast of self-assembled monolayer patterns in scanning electron micrographs depends on the operating primary electron beam voltage, monolayer composition, and monolayer order, suggesting that secondary electron emission and scattering can be used to elucidate chemical patterns.

Item Type:Article
Uncontrolled Keywords:chemical patterning; nanolithography; scanning electron microscopy; self-assembly; soft-lithography; microcontact printing
Subjects:Analytical Science > Microscopy and probe methods
Material Science > Nanostructured materials
ID Code:2362
Deposited By:Anuj Seth
Deposited On:17 Dec 2008 15:50
Last Modified:17 Dec 2008 15:50

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