Bogan, Michael J. and Benner, W. Henry and Boutet, Sebastien and Rohner, Urs and Frank, Matthias and Barty, Anton and Seibert, M. Marvin and Maia, Filipe and Marchesini, Stefano and Bajt, Sasa and Woods, Bruce and Riot, Vincent and Hau-Riege, Stefan P. and Svenda, Martin and Marklund, Erik and Spiller, Eberhard and Hajdu, Janos and Chapman, Henry N. (2008) Single particle X-ray diffractive imaging. NANO LETTERS, 8 (1). pp. 310-316.
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Official URL: http://dx.doi.org/10.1021/nl072728k
In nanotechnology, strategies for the creation and manipulation of nanoparticles in the gas phase are critically important for surface modification and substrate-free characterization. Recent coherent diffractive imaging with intense femtosecond X-ray pulses has verified the capability of single-shot imaging of nanoscale objects at suboptical resolutions beyond the radiation-induced damage threshold. By intercepting electrospray-generated particles with a single 15 femtosecond soft-X-ray pulse, we demonstrate diffractive imaging of a nanoscale specimen in free flight for the first time, an important step toward imaging uncrystallized biomolecules.
|Subjects:||Material Science > Nanochemistry|
Analytical Science > Beam methods
|Deposited By:||Anuj Seth|
|Deposited On:||18 Dec 2008 15:49|
|Last Modified:||18 Dec 2008 15:49|
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