Nano Archive

Specific features of high-field electron emission from nanostructured silicon dioxide

Kortov, V. S. and Zvonarev, S. V. (2008) Specific features of high-field electron emission from nanostructured silicon dioxide. Nanotechnologies in Russia, Volume 3 (1-2). pp. 101-105.

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Official URL: http://www.springerlink.com/content/k18wg7051628jj...

Abstract

A physical model of electron emission from charged dielectric films and near-surface layers of single-crystal dielectrics is modified to take into account properties of nanostructured materials. The model allows for electron scattering by grain boundaries and increase in the energy depth of surface carrier traps. Emission from nanostructured and single-crystal silicon dioxides is simulated. It is shown that nanostructured SiO2 is characterized by a lower emissivity, a wider emitted-electron energy spectrum, and a higher dielectric strength, as compared to single crystals.

Item Type:Article
Subjects:Physical Science > Nanophysics
Material Science > Nanochemistry
ID Code:2107
Deposited By:Prof. Alexey Ivanov
Deposited On:19 Dec 2008 13:14
Last Modified:16 Feb 2009 21:20

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