Nano Archive

Methodology and metrology for mechanical testing of nano-and microdimensional objects, materials, and products of nanotechnology

Goldstein, R. V. and Shturkin, N. A. and Kadushnikov, R. M. (2008) Methodology and metrology for mechanical testing of nano-and microdimensional objects, materials, and products of nanotechnology. Nanotechnologies in Russia, Volume 3 (1-2). pp. 112-121.

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Official URL: http://www.springerlink.com/content/3571421r160611...

Abstract

We propose a new approach to the development of methods, test systems, and metrology for mechanical testing of nano-and microdimensional objects, materials, structural elements, and related products. Discrete-continual models are presented, which can be used for simulating the deformation of nano-and microdimensional objects accounting for their structure, parameters of various interatomic interactions, and boundary conditions and for evaluating the range of mechanical loads and loading rates, which must be provided by the loading devices used in various mechanical tests. The models are described in application to samples representing isolated carbon nanotubes and their arrays. Results of model calculations of the load-displacement diagram and the ultimate deformation of a single-wall carbon nanotube under tensile testing conditions are presented. A computer model of the speckle interferometry system is developed that can be used for the monitoring of nanodisplacements in the course of sample loading for the experimental determination of the load-displacement diagram. The results can provide a basis for the analysis of new systems of mechanical testing of nano-and microdimensional objects within the framework of virtual metrology.

Item Type:Article
Subjects:Analytical Science > Nanotechnology for sensing and actuating
Analytical Science > Metrology and standards in nanotechnology
ID Code:2105
Deposited By:Prof. Alexey Ivanov
Deposited On:19 Dec 2008 13:14
Last Modified:01 Feb 2009 20:22

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