Komov, A.V. and Kurganskaya, A.N. and Shcherbak, L.V. (2006) Fast High Semivity Microwave Power Meier on SIC/SI Structures. Journal of NANO and MICROSYSTEM TECHNIQUE, 2 (2). pp. 28-35.
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This research dedicates to application of SiC/Si hetero structures for high power microwave measurement. The estimation of influence attendant effects on output signal is earned out. It is shown that such structures may be used for high power microwave measurements.
|Subjects:||Material Science > Nanostructured materials|
|Deposited By:||Prof. Alexey Ivanov|
|Deposited On:||19 Dec 2008 13:21|
|Last Modified:||06 Feb 2009 14:46|
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