Nano Archive

Testing Plate of Mullicrystal Micromodules (MCM) of Very-Large Scele Integration Circuit (VLSIC) for Avionic Systems.

S.A., Chetverov Yu.S.Fomichev M.A. Shkolnikov V. Ì. Zhukov A.A. Zhukova (2006) Testing Plate of Mullicrystal Micromodules (MCM) of Very-Large Scele Integration Circuit (VLSIC) for Avionic Systems. Journal of NANO and MICROSYSTEM TECHNIQUE, 3 (3). pp. 7-11.

Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.

Official URL: http://www.microsystems.ru/

Abstract

Topology of testing plate with high density of printed wiring for estimation electrical and physical parameters of thin film arrangement in multilevel com mutation-conversion devices for multicrystal micro-modules is developed. Manufacture process is offered and charac-teristics of multilevel structure on the base of metallization "vanadium-aluminum" with polyimide interlayer insulation are evaluated.

Item Type:Article
ID Code:2035
Deposited By:Prof. Alexey Ivanov
Deposited On:19 Dec 2008 13:21
Last Modified:20 Mar 2009 08:58

Repository Staff Only: item control page