Burkhanov, Ê. À. and Laletin , À. I. and Sigov , R. À. and Vorotilov, À. S. (2006) Particularities of Low- and Infralow Frequency Dielectric Response of BST Thin Films Prepared at Different Annealing Temperatures. Journal of NANO and MICROSYSTEM TECHNIQUE, 7 (7). pp. 42-44.
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A study of low- and infralow frequency properties of Ba0,7Sr0,3TiO3 thin fiims annealed at the temperatures of 750, 850 and 900 °C was carried out in a wide measurement range of the temperatures (-180 °C to +100 °C), frequencies (0.1 Hz to 10 kHz) and amplitudes of the electric field (15 kV/cm to 255 kV/cm). It was revealed that in the samples the gigantic relaxation, typical for layer heterogenic structures, took place. It was established that the more high annealing temperature (900 °C) results in a shift of relaxation region down to the lower measurement temperatures (or up to the more high measurement frequencies).
|Deposited By:||Prof. Alexey Ivanov|
|Deposited On:||19 Dec 2008 13:21|
|Last Modified:||20 Mar 2009 08:58|
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