Nano Archive

Particularities of Low- and Infralow Frequency Dielectric Response of BST Thin Films Prepared at Different Annealing Temperatures.

Burkhanov, Ê. À. and Laletin , À. I. and Sigov , R. À. and Vorotilov, À. S. (2006) Particularities of Low- and Infralow Frequency Dielectric Response of BST Thin Films Prepared at Different Annealing Temperatures. Journal of NANO and MICROSYSTEM TECHNIQUE, 7 (7). pp. 42-44.

Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.

Official URL: http://www.microsystems.ru/

Abstract

A study of low- and infralow frequency properties of Ba0,7Sr0,3TiO3 thin fiims annealed at the temperatures of 750, 850 and 900 °C was carried out in a wide measurement range of the temperatures (-180 °C to +100 °C), frequencies (0.1 Hz to 10 kHz) and amplitudes of the electric field (15 kV/cm to 255 kV/cm). It was revealed that in the samples the gigantic relaxation, typical for layer heterogenic structures, took place. It was established that the more high annealing temperature (900 °C) results in a shift of relaxation region down to the lower measurement temperatures (or up to the more high measurement frequencies).

Item Type:Article
ID Code:2012
Deposited By:Prof. Alexey Ivanov
Deposited On:19 Dec 2008 13:21
Last Modified:20 Mar 2009 08:58

Repository Staff Only: item control page