Brukhova, À. N. and Zaitsev, Yu. V. (2006) Spice Modeling and Parameter Extraction of Semi-Conductor Devices Using TCAD. Journal of NANO and MICROSYSTEM TECHNIQUE, 8 (8). pp. 25-30.
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Official URL: http://www.microsystems.ru/
Abstract
Spice modeling and parameter extraction is an important issue at the providing appropriate and reliable semi-conductor device models, including microsystem device models. This paper presents description and analysis different methods of extraction semi-conductor device models.
| Item Type: | Article |
|---|---|
| Subjects: | Analytical Science > Microscopy and probe methods Analytical Science > Metrology and standards in nanotechnology |
| ID Code: | 2006 |
| Deposited By: | Prof. Alexey Ivanov |
| Deposited On: | 19 Dec 2008 13:21 |
| Last Modified: | 13 Feb 2009 09:20 |
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