Brukhova, À. N. and Zaitsev, Yu. V. (2006) Spice Modeling and Parameter Extraction of Semi-Conductor Devices Using TCAD. Journal of NANO and MICROSYSTEM TECHNIQUE, 8 (8). pp. 25-30.
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Official URL: http://www.microsystems.ru/
Spice modeling and parameter extraction is an important issue at the providing appropriate and reliable semi-conductor device models, including microsystem device models. This paper presents description and analysis different methods of extraction semi-conductor device models.
|Subjects:||Analytical Science > Microscopy and probe methods|
Analytical Science > Metrology and standards in nanotechnology
|Deposited By:||Prof. Alexey Ivanov|
|Deposited On:||19 Dec 2008 13:21|
|Last Modified:||13 Feb 2009 09:20|
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