Nano Archive

Localized current injection and submicron organic light-emitting device on a pyramidal atomic force microscopy tip

Zhao, Yiying and An, Kwang H. and Chen, Shuo and O'Connor, Brendan and Pipe, Kevin P. and Shtein, Max (2007) Localized current injection and submicron organic light-emitting device on a pyramidal atomic force microscopy tip. NANO LETTERS, 7 (12). pp. 3645-3649.

Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.

Official URL: http://pubs.acs.org/doi/abs/10.1021/nl071883w

Abstract

An organic light-emitting device was fabricated on a commercial atomic force microscopy (AFM) probe having a pyramidal tip by a lithography-free vacuum thermal evaporation (VTE) process. The line-of-sight molecular transport characteristic of VTE results in controlled thickness variation across the nonplanar substrate, such that localized current injection occurs at the tip region. Furthermore, the high curvature of the AFM tip vertex concentrates the electric field, causing highly localized bipolar charge injection, accompanied by photon emission from a region less than a micrometer across. This light source exhibits a range of features potentially attractive for applications such as probe-based optical microscopy, nanoscale light sensing, and chemical detection.

Item Type:Article
Subjects:Analytical Science > Microscopy and probe methods
Physical Science > Nanophysics
Analytical Science > Nanotechnology for sensing and actuating
Physical Science > Nanoelectronics
ID Code:1896
Deposited By:Farnush Anwar
Deposited On:16 Dec 2008 16:50
Last Modified:12 Jan 2009 10:24

Repository Staff Only: item control page