Rau, C and Crecea, V and Richter, C. -P. and Peterson, K. M. and Jemian, P. R. and Neuhaeusler, U and Schneider, G and Yu, X and Braun, V and Chiang, T. -C. and Robinson, I. K. (2007) Imaging of micro- and nano-structures with hard X-rays. MICRO & NANO LETTERS, 2 (1). pp. 1-5.
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Abstract
Imaging of micro- and nano-structures of opaque samples is demonstrated using hard X-rays. Two different methods are employed with an instrument recently built at the beamline 34 ID-C at the Advanced Photon Source. In-line phase contrast micro-imaging has been performed with highly coherent radiation. For the characterisation of structures as small as 50 nm, a hard X-ray microscope has been built. These complementary techniques cover a large range of length-scales.
| Item Type: | Article |
|---|---|
| Subjects: | Analytical Science > Microscopy and probe methods Analytical Science > Nanotechnology for sensing and actuating |
| ID Code: | 1864 |
| Deposited By: | Farnush Anwar |
| Deposited On: | 23 Dec 2008 11:02 |
| Last Modified: | 13 Feb 2009 09:16 |
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