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Fabrication and electrical characterization of circuits based on individual tin oxide nanowires

Hernández-Ramírez, Francisco and Tarancon, Albert and Casals, Olga and Rodriguez, Jordi and Romano-Rodriguez, Albert and Morante, Joan R and Barth, Sven and Mathur, Sanjay and Choi, Tae-Youl and Poulikakos, Dimos and Callegari, Victor and Nellen, Philipp M (2006) Fabrication and electrical characterization of circuits based on individual tin oxide nanowires. Nanotechnology, 17 (22). p. 5577. ISSN 09574484

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Official URL: http://dx.doi.org/10.1088/0957-4484/17/22/009

Abstract

Two- and four-probe electrical measurements on individual tin oxide (SnO2)nanowires were performed to evaluate their conductivity and contact resistance. Electrical contacts between the nanowires and the microelectrodes were achieved with the help of an electron- and ion-beam-assisted direct-write nanolithography process. High contact resistance values and the nonlinear current–bias (I–V ) characteristics of some of these devices observed in two-probe measurements can be explained by the existence of back-to-back Schottky barriers arising from the platinum–nanowire contacts. The nanoscale devices described herein were characterized using impedance spectroscopy, enabling the development of an equivalent circuit. The proposed methodology of nanocontacting and measurements can be easily applied to other nanowires and nanometre-sized materials.

Item Type:Article
Subjects:Material Science > Nanofabrication processes and tools
Physical Science > Nanoelectronics
ID Code:185
Deposited By:Lesley Tobin
Deposited On:13 Nov 2008 12:44
Last Modified:31 Mar 2009 17:25

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