Danelyan, A. G. and Kankia, R. R. and Mkrtychyan, C. A. and Gharibashvili, D. I. and Lomidze, I. R. (2010) Nanometrology: Topicality and problems [in Russian]. Nano Studies, 2 . pp. 45-52. ISSN 1987-8826
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Official URL: http://www.tech.caucasus.net
Abstract
There are discussed some principal problems of nanometrology.
| Item Type: | Article |
|---|---|
| Subjects: | Analytical Science > Metrology and standards in nanotechnology |
| Divisions: | Faculty of Engineering, Science and Mathematics > School of Physics |
| ID Code: | 11753 |
| Deposited By: | Professor Levan Chkhartishvili |
| Deposited On: | 20 Jan 2012 17:32 |
| Last Modified: | 20 Jan 2012 17:32 |
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