Buhr, E and Senftleben, N and Klein, T and Bergmann, D and Gnieser, D and Frase, C G and Bosse, H (2009) Characterization of nanoparticles by scanning electron microscopy in transmission mode. Measurement Science and Technology, 20 (8). 084025.
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Official URL: http://stacks.iop.org/0957-0233/20/i=8/a=084025
A conventional scanning electron microscope operated in transmission mode (TSEM) was used for imaging silica, gold and latex nanoparticles. Particles were applied to conventional transmission electron microscope (TEM) grids with different supporting films. A semiconductor detector capable of accomplishing both bright-field and dark-field imaging was used to record transmitted electrons. Particle diameter was determined from the images by comparing measured data with the results of corresponding Monte Carlo simulations which took into account particle and instrument properties. Measured and simulated line profiles agreed well; the method is sensitive to changes in diameter in the nano- and sub-nanometre range. It is concluded that TSEM imaging is a promising tool for dimensional characterization of nanoparticles. Necessary extensions to the technique in order to achieve traceable measurements are discussed.
|Deposited By:||Prof. Alexey Ivanov|
|Deposited On:||02 Nov 2011 00:06|
|Last Modified:||02 Nov 2011 00:47|
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