Nano Archive

Capabilities of ICP-RIE cryogenic dry etching of silicon: review of exemplary microstructures

Sökmen, Ü and Stranz, A and Fündling, S and Wehmann, H-H and Bandalo, V and Bora, A and Tornow, M and Waag, A and Peiner, E (2009) Capabilities of ICP-RIE cryogenic dry etching of silicon: review of exemplary microstructures. Journal of Micromechanics and Microengineering, 19 (10). p. 105005.

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Official URL: http://stacks.iop.org/0960-1317/19/i=10/a=105005

Abstract

Inductively coupled plasma (ICP) cryogenic dry etching was used to etch submicron pores, nano contact lines, submicron diameter pillars, thin and thick cantilevers, membrane structures and anisotropic deep structures with high aspect ratios in silicon for bio-nanoelectronics, optoelectronics and nano-micro electromechanical systems (NMEMS). The ICP cryogenic dry etching gives us the advantage of switching plasmas between etch rates of 13 nm min −1 and 4 µm min −1 for submicron pores and for membrane structures, respectively. A very thin photoresist mask can endure at −75 °C even during etching 70 µm deep for cantilevers and 300 µm deep for membrane structures. Coating the backsides of silicon membrane substrates with a thin photoresist film inhibited the lateral etching of cantilevers during their front release. Between −95 °C and −140 °C, we realized crystallographic-plane-dependent etching that creates facets only at the etch profile bottom. By varying the oxygen content and the process temperature, we achieved good control over the shape of the etched structures. The formation of black silicon during membrane etching down to 300 µm was delayed by reducing the oxygen content.

Item Type:Article
ID Code:11306
Deposited By:Prof. Alexey Ivanov
Deposited On:02 Nov 2011 00:23
Last Modified:02 Nov 2011 00:47

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