Dayen, J-F and Faramarzi, V and Pauly, M and Kemp, N T and Barbero, M and Pichon, B P and Majjad, H and Begin-Colin, S and Doudin, B (2010) Nanotrench for nano and microparticle electrical interconnects. Nanotechnology, 21 (33). p. 335303.
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Official URL: http://stacks.iop.org/0957-4484/21/i=33/a=335303
We present a simple and versatile patterning procedure for the reliable and reproducible fabrication of high aspect ratio (10 4 ) electrical interconnects that have separation distances down to 20 nm and lengths of several hundreds of microns. The process uses standard optical lithography techniques and allows parallel processing of many junctions, making it easily scalable and industrially relevant. We demonstrate the suitability of these nanotrenches as electrical interconnects for addressing micro and nanoparticles by realizing several circuits with integrated species. Furthermore, low impedance metalâmetal low contacts are shown to be obtained when trapping a single metal-coated microsphere in the gap, emphasizing the intrinsic good electrical conductivity of the interconnects, even though a wet process is used. Highly resistive magnetite-based nanoparticles networks also demonstrate the advantage of the high aspect ratio of the nanotrenches for providing access to electrical properties of highly resistive materials, with leakage current levels below 1 pA.
|Deposited By:||Prof. Alexey Ivanov|
|Deposited On:||01 Nov 2011 23:27|
|Last Modified:||02 Nov 2011 00:47|
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