Sato, Takaaki and Ishida, Tadashi and Nabeya, Shinsuke and Fujita, Hiroyuki (2010) Nano-scale observation of frictional deformation at Ag single point contact with MEMS-in-TEM setup. Journal of Physics: Conference Series, 258 (1). 012005.
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Official URL: http://stacks.iop.org/1742-6596/258/i=1/a=012005
Abstract
Monitoring atomic-level deformation of a frictional interface in real time is crucial for tribology research at micro and nano scale. We have combined nano-scale handling capabilities of MEMS technology with the supreme observation ability of TEM and developed a MEMS-in-TEM experimental setup. We succeeded in observing the frictional deformation of silver interface and measuring its shear force simultaneously.
| Item Type: | Article |
|---|---|
| ID Code: | 11190 |
| Deposited By: | Prof. Alexey Ivanov |
| Deposited On: | 01 Nov 2011 23:26 |
| Last Modified: | 02 Nov 2011 00:47 |
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