Diso, D G and Fauzi, F and Echendu, O K and Weerasinghe, A R and Dharmadasa, I M (2011) Electrodeposition and characterisation of ZnTe layers for application in CdTe based multi-layer graded bandgap solar cells. Journal of Physics: Conference Series, 286 (1). 012040.
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Official URL: http://stacks.iop.org/1742-6596/286/i=1/a=012040
Zinc Telluride (ZnTe) thin films have been deposited on glass/conducting glass substrates using low-cost aqueous electrodeposition (ED) method. The structural, optical and morphological properties of the resulting films have been characterized using X-ray diffraction (XRD), spectrophotometry and Scanning Electron Microscopy (SEM). It has been confirmed by XRD technique that the deposited layers are nano- and polycrystalline mixture for as deposited layers. Photoelectrochemical (PEC) studies revealed that the layers are p-type in electrical conduction. Optical absorption measurement has been used for the bandgap determination of the deposited layers. The bandgap of the polycrystalline ZnTe layers are in the range (2.65 â 2.75) eV for the ZnSO 4 precursor, and (2.70 â 2.87) eV for the ZnCl 2 precursor instead of (2.21 â 2.26) eV reported for crystalline ZnTe. This increase may be due to the quantum effect which confirmed by the absence of strong XRD peaks from these layers and/or inclusion of ZnO in the deposited layers.
|Deposited By:||Prof. Alexey Ivanov|
|Deposited On:||01 Nov 2011 23:24|
|Last Modified:||02 Nov 2011 00:47|
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