Nano Archive

13th International Conference on Metrology and Properties of Engineering Surfaces

Leach, Richard (2011) 13th International Conference on Metrology and Properties of Engineering Surfaces. Journal of Physics: Conference Series, 311 (1). 011001.

Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.

Official URL: http://stacks.iop.org/1742-6596/311/i=1/a=011001

Abstract

The 13th International Conference on Metrology and Properties of Engineering Surfaces focused on the progress in surface metrology, surface characterisation instrumentation and properties of engineering surfaces. The conference provided an international forum for academics, industrialists and engineers from different disciplines to meet and exchange their ideas, results and latest research. The conference was held at Twickenham Stadium, situated approximately six miles from Heathrow Airport and approximately three miles from the National Physical Laboratory (NPL). This was the thirteenth in the very successful series of conferences, which have firmly established surface topography as a new and exciting interdisciplinary field of scientific and technological studies. Scientific Themes: * Surface, Micro and Nano Metrology * Measurement and Instrumentation * Metrology for MST Devices * Freeform Surface Measurement and Characterisation * Uncertainty, Traceability and Calibration * AFM/SPM Metrology * Tribology and Wear Phenomena * Functional Applications * Stylus and Optical Instruments

Item Type:Article
ID Code:11138
Deposited By:Prof. Alexey Ivanov
Deposited On:01 Nov 2011 23:57
Last Modified:02 Nov 2011 00:47

Repository Staff Only: item control page