Stavarache, Ionel and Lepadatu, Ana-Maria and Teodorescu, Valentin Serban and Ciurea, Lidia Magdalena and Iancu, Vladimir and Dragoman, Mircea and Konstantinidis, George and Buiculescu, Raluca (2011) Electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitride. Nanoscale Research Letters, 6 (1). pp. 1-6.
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Official URL: http://www.nanoscalereslett.com/content/6/1/88/com...
Abstract
The electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitride is studied by measuring the voltage and temperature dependences of the current. The microstructure of the network is investigated by cross-sectional transmission electron microscopy. The multi-walled carbon nanotube network has an uniform spatial extension in the silicon nitride matrix. The current-voltage and resistance-temperature characteristics are both linear, proving the metallic behavior of the network. The I-V curves present oscillations that are further analyzed by computing the conductance-voltage characteristics. The conductance presents minima and maxima that appear at the same voltage for both bias polarities, at both 20 and 298 K, and that are not periodic. These oscillations are interpreted as due to percolation processes. The voltage percolation thresholds are identified with the conductance minima.
| Item Type: | Article |
|---|---|
| Subjects: | Physical Science > Nanophysics Physical Science > Nano objects Material Science > Nanochemistry Material Science > Nanostructured materials |
| Divisions: | Faculty of Engineering, Science and Mathematics > School of Physics Faculty of Engineering, Science and Mathematics > School of Chemistry |
| ID Code: | 10886 |
| Deposited By: | JNCASR |
| Deposited On: | 18 Oct 2011 10:35 |
| Last Modified: | 18 Oct 2011 10:35 |
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