Giannazzo, Filippo and Sonde, Sushant and Rimini, Emanuele and Raineri, Vito (2011) Lateral homogeneity of the electronic properties in pristine and ion-irradiated graphene probed by scanning capacitance spectroscopy. Nanoscale Research Letters, 6 (1). pp. 1-8.
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Official URL: http://www.nanoscalereslett.com/content/6/1/109
Abstract
In this article, a scanning probe method based on nanoscale capacitance measurements was used to investigate the lateral homogeneity of the electron mean free path both in pristine and ion-irradiated graphene. The local variations in the electronic transport properties were explained taking into account the scattering of electrons by charged impurities and point defects (vacancies). Electron mean free path is mainly limited by charged impurities in unirradiated graphene, whereas an important role is played by lattice vacancies after irradiation. The local density of the charged impurities and vacancies were determined for different irradiated ion fluences.
| Item Type: | Article |
|---|---|
| Subjects: | Physical Science > Nanophysics Physical Science > Nano objects Material Science > Nanochemistry |
| Divisions: | Faculty of Engineering, Science and Mathematics > School of Physics Faculty of Engineering, Science and Mathematics > School of Chemistry |
| ID Code: | 10864 |
| Deposited By: | JNCASR |
| Deposited On: | 20 Oct 2011 10:13 |
| Last Modified: | 20 Oct 2011 10:13 |
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