Fiorenza, Patrick and Lo Nigro, Raffaella and Raineri, Vito (2011) Scanning Probe Microscopy on heterogeneous CaCu3Ti4O12 thin films. Nanoscale Research Letters, 6 (1). pp. 1-4.
Official URL: http://www.nanoscalereslett.com/content/6/1/118
The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu3Ti4O12 (CCTO) thin films deposited by MOCVD on IrO2 bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular features in terms of conductive and insulating regions. The microstructure and the dielectric properties of CCTO thin films have been studied and the evidence of internal barriers in CCTO thin films has been provided. The role of internal barriers and the possible explanation for the extrinsic origin of the giant dielectric response in CCTO has been evaluated.
|Subjects:||Physical Science > Nanophysics|
Physical Science > Nano objects
Material Science > Nanochemistry
Material Science > Nanostructured materials
|Divisions:||Faculty of Engineering, Science and Mathematics > School of Chemistry|
|Deposited On:||25 Oct 2011 10:57|
|Last Modified:||25 Oct 2011 10:57|
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